The AFBR-S4K33C0115L is a high-performance Silicon Photomultiplier (SiPM) array based on the Near Ultraviolet High-Density (NUV-HD) technology. It is designed for ultra-sensitive measurement of single photons and is particularly sensitive to the blue and near-UV spectrum. The device utilizes Through-Silicon-Via (TSV) technology to achieve high packing density and features a 3.0 x 3.0 mm active area per channel. It is commonly used for detecting scintillation light from materials like LSO, LYSO, and BGO in medical and high-energy physics applications.
Checking distributor stock and pricing after the page loads.
Sign in to ask questions about the Broadcom AFBR-S4K33C0115L datasheet using AI. Get instant answers about specifications, features, and technical details, ideal for finding information in larger documents.
Sign In to ChatWidest selection of semiconductors and electronic components in stock and ready to ship ™
| Active Area | 3.0 x 3.0mm |
| Photon Detection Efficiency (PDE) | 54 at 420 nm% |
| Cell Pitch | 30 x 30µm |
| Breakdown Voltage Uniformity (3 Sigma) | 180mV |
| Operating Temperature Range | -40 to +85°C |
| Number of Channels | 1 (Single) |
| RoHS | Compliant |
| REACH | Compliant |
Download the complete datasheet for Broadcom AFBR-S4K33C0115L to view detailed technical specifications.
The embedded preview will load automatically when this section scrolls into view.