IEC60730B Library User's Guide for LPC55Sxx and LPC55xx Families
User guide for the NXP IEC60730B safety library supporting LPC55Sxx MCUs, providing self-test functions for IEC 60730, IEC 60335, and UL 60730 compliance.
Overview
This document is a technical user guide for the NXP IEC60730B core self-test library, specifically designed for LPC55Sxx and LPC55xx microcontroller families based on the Arm Cortex-M33 core. The library provides a suite of independent functions to perform mandatory MCU self-tests required for compliance with international safety standards including IEC 60730, IEC 60335, UL 60730, and UL 1998. It covers core-dependent tests such as CPU registers, program counter, variable memory (RAM), invariable memory (Flash), and stack integrity. Additionally, it includes peripheral-dependent tests for clocks, digital and analog I/O, watchdogs, and touch-sensing interfaces (TSIv5). The guide details library integration for IAR, Keil, and MCUXpresso IDEs and provides performance data including function sizes and execution durations.
Use Cases
- Industrial safety compliance for embedded systems
- Home appliance safety certification (Class B)
- Microcontroller diagnostic self-testing
- Functional safety software development for LPC55Sxx MCUs
- Consumer electronics safety standard adherence