
8-bit, 3-state, non-inverting D-type scan test device with positive edge clock triggering. Operates at up to 70MHz with a 4.5V to 5.5V supply voltage. Features BICMOS technology, SOIC package for surface mounting, and 6.7ns propagation delay. RoHS compliant with a maximum operating temperature of 70°C.
Texas Instruments SN74BCT8374ADW technical specifications.
| Package/Case | SOIC |
| Clock Edge Trigger Type | Positive Edge |
| Frequency | 70MHz |
| High Level Output Current | -15mA |
| Lead Free | Lead Free |
| Logic Function | D-Type |
| Low Level Output Current | 64mA |
| Max Frequency | 70MHz |
| Max Operating Temperature | 70°C |
| Min Operating Temperature | 0°C |
| Max Supply Voltage | 5.5V |
| Min Supply Voltage | 4.5V |
| Mount | Surface Mount |
| Number of Bits | 8 |
| Number of Elements | 1 |
| Number of Outputs | 8 |
| Output Current | 64mA |
| Output Type | 3-STATE |
| Packaging | Rail/Tube |
| Polarity | Non-Inverting |
| Propagation Delay | 6.7ns |
| Radiation Hardening | No |
| Reach SVHC Compliant | No |
| RoHS Compliant | Yes |
| Series | 74BCT |
| Technology | BICMOS |
| Termination | SMD/SMT |
| Turn-On Delay Time | 11ns |
| Weight | 0.022025oz |
| RoHS | Compliant |
Download the complete datasheet for Texas Instruments SN74BCT8374ADW to view detailed technical specifications.
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