8-bit, 3-state, non-inverting D-type scan test device with positive edge clock triggering. Operates at up to 70MHz with a 4.5V to 5.5V supply voltage. Features BICMOS technology, SOIC package for surface mounting, and 6.7ns propagation delay. RoHS compliant with a maximum operating temperature of 70°C.
Frequency70MHz
PackageSOIC
MountingSurface Mount
PolarityNon-Inverting
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Technical Specifications
Texas Instruments SN74BCT8374ADW technical specifications.
General
Package/Case
SOIC
Clock Edge Trigger Type
Positive Edge
Frequency
70MHz
High Level Output Current
-15mA
Lead Free
Lead Free
Logic Function
D-Type
Low Level Output Current
64mA
Max Frequency
70MHz
Max Operating Temperature
70°C
Min Operating Temperature
0°C
Max Supply Voltage
5.5V
Min Supply Voltage
4.5V
Mount
Surface Mount
Number of Bits
8
Number of Elements
1
Number of Outputs
8
Output Current
64mA
Output Type
3-STATE
Packaging
Rail/Tube
Polarity
Non-Inverting
Propagation Delay
6.7ns
Radiation Hardening
No
Reach SVHC Compliant
No
RoHS Compliant
Yes
Series
74BCT
Technology
BICMOS
Termination
SMD/SMT
Turn-On Delay Time
11ns
Weight
0.022025oz
Compliance
RoHS
Compliant
Datasheet
Texas Instruments SN74BCT8374ADW Datasheet
Download the complete datasheet for Texas Instruments SN74BCT8374ADW to view detailed technical specifications.
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