Application NoteNxp

i.MX 6ULL Product Usage Lifetime Estimates

Provides Power-on Hour (PoH) lifetime estimates for i.MX 6ULL processors based on qualification levels, operating frequency, voltage, and junction temperature.

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Overview

This application note describes the estimated product lifetimes for NXP i.MX 6ULL applications processors. It details how Power-on Hours (PoH) are affected by qualification levels (commercial and industrial), ARM core frequency, and junction temperature (Tj). The document provides specific PoH data for LDO-enabled and LDO-bypassed modes, noting that higher frequencies like 800 MHz and 900 MHz require LDO-enabled mode. Additionally, it includes formulas and methodologies for calculating cumulative lifetime when an application switches between multiple power states or operating temperatures.

Use Cases

Estimating processor longevity for industrial and commercial product designs
Optimizing thermal management to extend device PoH
Calculating reliability for applications switching between multiple power states
Determining trade-offs between ARM core frequency and device lifetime

Topics

NXP

i.MX 6ULL

Power-on Hours

PoH

Junction Temperature

LDO-enabled

LDO-bypassed

Industrial Qualification

Commercial Qualification

Reliability

Processor Lifetime

Referenced Parts

i.MX 6ULL

NXP

This document describes the estimated product lifetimes for the i.MX 6ULL applications processors

i.MX 6

NXP

The i.MX 6 series consists of an extensive number of processors that deliver a wide range of processing and multimedia capabilities across various qualification levels.

i.MX 6ULL	NXP	This document describes the estimated product lifetimes for the i.MX 6ULL applications processors
i.MX 6	NXP	The i.MX 6 series consists of an extensive number of processors that deliver a wide range of processing and multimedia capabilities across various qualification levels.