MC56F83789
NXP
The function parameter was measured in the CodeWarrior 11.1. IDE on MC56F83789 with the clock frequency of 50 MHz.
Design DocumentNxp
IEC60730B 56800EX Library User's Guide
User guide for the NXP IEC60730B safety library for 56800EX DSCs. Provides self-test functions for CPU, memory, and I/O to meet IEC 60730 and UL 60730 standards.
Overview
This document describes the NXP IEC60730B core self-test library designed for the 56800EX-based Digital Signal Controller (DSC) families, including 56F81xxx, 56F82xxx, 56F83xxx, 56F84xxx, and 56F80xxx. The library provides independent software functions to perform MCU core self-tests compliant with international safety standards such as IEC 60730, IEC 60335, and UL 60730. It covers critical diagnostic tests for CPU registers, program counters, variable memory (RAM), invariable memory (Flash), stack integrity, system clocks, digital and analog I/O, and watchdog timers. The guide includes implementation details for the CodeWarrior IDE, function performance measurements on the MC56F83789 processor, and API descriptions for integrating safety routines into industrial and consumer applications.
Use Cases
- Compliance with IEC 60730 Class B safety standards for household appliances
- Implementation of self-test routines for industrial control systems
- Safety-critical software development for NXP 56800EX Digital Signal Controllers
- Functional safety diagnostics for CPU, RAM, and Flash memory
- Hardware integrity verification during MCU runtime and reset
Topics
NXP
MC56F83789
56800EX
IEC 60730
UL 60730
DSC
Safety Library
Self-test
CPU Diagnostics
Memory Test
Referenced Parts
| MC56F83789 | NXP | The function parameter was measured in the CodeWarrior 11.1. IDE on MC56F83789 with the clock frequency of 50 MHz. |