Design DocumentNxp

IEC60730B Library User's Guide for ARM Cortex-M0+ MCUs

NXP IEC60730B safety library guide for ARM Cortex-M0+ MCUs, detailing core and peripheral self-test functions for compliance with IEC 60730, IEC 60335, and UL 60730 standards.

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Overview

This document provides a comprehensive guide to the IEC60730B core self-test library version 4.2, designed for NXP microcontrollers based on the ARM Cortex-M0+ core. The library facilitates compliance with international safety standards such as IEC 60730, IEC 60335, UL 60730, and UL 1998. It contains both core-dependent tests (CPU registers, program counter, stack, variable and invariable memory) and peripheral-dependent tests (Clock, Digital IO, Analog IO, Watchdog, and Touch-Sensing Interface). The guide details support for IAR, Keil, and MCUXpresso IDEs and provides specific function implementations for families including MKV1x, MKLxx, MKE0x, MKE1xZ, MKW3x, K32L2, LPC51U68, and the LPC800 series.

Use Cases

Safety-critical household appliance development
Functional safety certification for industrial controls
Embedded system diagnostic implementation
MCU self-test integration for UL/IEC standards compliance

Topics

IEC 60730

Functional Safety

ARM Cortex-M0+

Self-test library

LPC51U68

K32L2A

MKV10Z

MKE15Z

LPC845

CPU diagnostic

RAM test

Flash test

Referenced Parts

LPC51U68

NXP Semiconductors

Table 6 shows the list of functions dedicated for the LPC51U68 device family.

LPC824

NXP Semiconductors

The function parameter was measured on LPC824 with a clock frequency of 30 MHz.

LPC845

NXP Semiconductors

The function parameter was measured on LPC845 with a clock frequency of 30 MHz.

MK32L2A

NXP Semiconductors

Table 7 shows the list of functions dedicated for the MK32L2A device.

MK32L2B

NXP Semiconductors

Table 8 shows the list of functions dedicated for the MK32L2B device.

MK32L3

NXP Semiconductors

Table 14 shows the list of functions dedicated for the MK32L3 CM0 core.

MKE02Z

NXP Semiconductors

The function parameter was measured on MKE02Z with a clock frequency of 40 MHz.

MKE15Z

NXP Semiconductors

The function parameter was measured on MKE15Z with a clock frequency of 72 MHz.

MKL26Z

NXP Semiconductors

The function parameter was measured on MKL26Z with a clock frequency of 48 MHz.

MKV10Z

NXP Semiconductors

The function parameter was measured on MKV10Z with a clock frequency of 75 MHz.

LPC51U68	NXP Semiconductors	Table 6 shows the list of functions dedicated for the LPC51U68 device family.
LPC824	NXP Semiconductors	The function parameter was measured on LPC824 with a clock frequency of 30 MHz.
LPC845	NXP Semiconductors	The function parameter was measured on LPC845 with a clock frequency of 30 MHz.
MK32L2A	NXP Semiconductors	Table 7 shows the list of functions dedicated for the MK32L2A device.
MK32L2B	NXP Semiconductors	Table 8 shows the list of functions dedicated for the MK32L2B device.
MK32L3	NXP Semiconductors	Table 14 shows the list of functions dedicated for the MK32L3 CM0 core.
MKE02Z	NXP Semiconductors	The function parameter was measured on MKE02Z with a clock frequency of 40 MHz.
MKE15Z	NXP Semiconductors	The function parameter was measured on MKE15Z with a clock frequency of 72 MHz.
MKL26Z	NXP Semiconductors	The function parameter was measured on MKL26Z with a clock frequency of 48 MHz.
MKV10Z	NXP Semiconductors	The function parameter was measured on MKV10Z with a clock frequency of 75 MHz.