MPC5744P
NXP
The BIST for MPC5744P assumes the device is using a 16 MHz IRC to source the Phase-Locked-Loop (PLL).
Application NoteNxp
MPC5744P Startup Self-Test Control Unit (STCU) Overview
Technical overview of the Startup Built-In Self-Test (BIST) for the NXP MPC5744P MCU, covering STCU configuration, memory and logic partitions, and ASIL D safety compliance.
Overview
This application note details the Self-Test Control Unit (STCU) default configuration for the NXP MPC5744P microcontroller. It describes the Startup Built-In Self-Test (BIST) process, including Memory Built-In Self-Test (MBIST) for 27 partitions and Logic Built-In Self-Test (LBIST) for 4 partitions. The document provides clock settings, specifying a 50 MHz STCU frequency derived from a 200 MHz PLL, and lists worst-case execution times for the self-test sequences. It also explains how to enable or disable tests via Device Configuration Format (DCF) records in the UTEST flash memory and outlines fault handling procedures using the STCU2 status registers to ensure ASIL D compliance.
Use Cases
- Automotive functional safety implementation
- Configuring microcontroller power-on self-tests
- Developing ASIL D compliant embedded systems
- Optimizing MCU startup and reset timing
- Monitoring hardware diagnostic status via STCU registers
Topics
MPC5744P
STCU
BIST
MBIST
LBIST
ASIL D
Functional Safety
Microcontroller
Self-Test Control Unit
NXP
Referenced Parts
| MPC5744P | NXP | The BIST for MPC5744P assumes the device is using a 16 MHz IRC to source the Phase-Locked-Loop (PLL). |