MPC574xP FCCU Fault Sources Application Note

Overview

This application note provides a detailed description of the Fault Collection and Control Unit (FCCU) fault sources for NXP MPC574xP microcontrollers, specifically the MPC5744P. It covers fault management, mapping of non-critical faults (NCF), and specific descriptions for 74 fault signals. Key fault sources discussed include temperature sensors, low-voltage and high-voltage detectors (LVD/HVD), memory ECC errors, clock monitoring (CMU), core redundancy mismatches, and built-in self-test (BIST) results. The document explains how to use FCCU configuration registers to define fault importance and response behavior.

Referenced Parts