MPC5744P
NXP
The MPC5744P device targets chassis and safety applications which require a high Automotive Safety Integrity Level (SIL).
Application NoteNxp
Using the Built-in Self-Test (BIST) on the MPC5744P
Technical guide for configuring Logic BIST (LBIST) and Memory BIST (MBIST) on the NXP MPC5744P MCU to meet ISO26262 ASIL-D automotive safety requirements.
Overview
This application note describes the implementation and configuration of Built-In Self-Test (BIST) features on the NXP MPC5744P microcontroller. It details the two primary BIST types: MBIST for embedded memory/SRAM testing and LBIST for digital logic testing across multiple partitions including the CPU, DMA, and peripherals. The document explains the operation of the Self-Test Control Unit (STCU2) and differentiates between offline BIST, which executes during device startup via Device Configuration Format (DCF) records, and online BIST, which is software-triggered during runtime or shutdown. It provides specific partitioning tables, expected Multiple Input Signature Register (MISR) values, and configuration strategies to help developers detect latent defects and achieve ISO26262 ASIL-D functional safety compliance.
Use Cases
- Automotive safety application development requiring ASIL-D integrity levels.
- Configuring startup self-test sequences to detect latent hardware defects.
- Implementing runtime diagnostics for memory and logic partitions.
- Developing shutdown routines for maximum test coverage in chassis and safety systems.
Topics
MPC5744P
BIST
LBIST
MBIST
STCU2
ISO26262
ASIL-D
Functional Safety
Self-Test Control Unit
Latent Fault Detection
DCF Records
Automotive MCU
Referenced Parts
AN11993
NXP
Document Number: AN11993 NXP Semiconductors
| MPC5744P | NXP | The MPC5744P device targets chassis and safety applications which require a high Automotive Safety Integrity Level (SIL). |
| AN11993 | NXP | Document Number: AN11993 NXP Semiconductors |