MPC5744P
NXP Semiconductors
The MPC5744P device targets chassis and safety applications, which require a high Automotive Safety Integrity Level (ASIL).
Application NoteNxp
Using the Power Management Controller block (PMC) self-tests on the MPC574xP
Technical guide for configuring PMC self-tests on NXP MPC574xP MCUs to detect latent voltage detector faults and satisfy ISO26262 ASIL D safety requirements.
Overview
This application note describes the implementation and configuration of Power Management Controller (PMC) self-tests for NXP MPC574xP microcontrollers, including the MPC5744P. It details hardware-triggered startup tests and software-triggered procedures used to identify latent defects in integrated voltage detectors (LVD/HVD). The document explains the Self-test Time Window (STTW) mechanism, watchdog timer calculations based on PBRIDGE clock frequencies, and procedures for testing specific voltage domains such as core, flash, ADC, and oscillator supplies. These built-in self-tests (BIST) are critical for automotive applications targeting ISO26262 ASIL D functional safety compliance.
Use Cases
- Automotive chassis and safety application design
- ISO26262 ASIL D functional safety compliance development
- Periodic software-triggered hardware self-testing for latent fault detection
- Voltage monitoring and power supply fault handling in microcontrollers
Topics
MPC574xP
MPC5744P
PMC
Self-test
ISO26262
ASIL D
Voltage Detector
LVD
HVD
BIST
Functional Safety
STTW
Referenced Parts
MPC574xP
NXP Semiconductors
This application note introduces PMC self-tests on the MPC574xP and explains how to configure and use PMC self-test features of the MPC574xP.
| MPC5744P | NXP Semiconductors | The MPC5744P device targets chassis and safety applications, which require a high Automotive Safety Integrity Level (ASIL). |
| MPC574xP | NXP Semiconductors | This application note introduces PMC self-tests on the MPC574xP and explains how to configure and use PMC self-test features of the MPC574xP. |