The 74AUP2G38GN,115 is a dual NAND gate integrated circuit from NXP. It operates at a maximum supply voltage of 3.6V and can withstand temperatures up to 125°C. The device features a low quiescent current of 500nA and a propagation delay of 12.7ns. It is available in a surface mount package and is compliant with RoHS regulations.
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NXP 74AUP2G38GN,115 technical specifications.
| Logic Function | NAND GATE |
| Low Level Output Current | 4mA |
| Max Operating Temperature | 125°C |
| Min Operating Temperature | -40°C |
| Max Supply Voltage | 3.6V |
| Min Supply Voltage | 800mV |
| Mount | Surface Mount |
| Number of Circuits | 2 |
| Number of Elements | 2 |
| Number of Inputs | 2 |
| Number of Outputs | 1 |
| Package Quantity | 5000 |
| Packaging | Tape and Reel |
| Propagation Delay | 12.7ns |
| Quiescent Current | 500nA |
| Radiation Hardening | No |
| RoHS Compliant | Yes |
| Series | 74AUP |
| Technology | CMOS |
| RoHS | Compliant |
Download the complete datasheet for NXP 74AUP2G38GN,115 to view detailed technical specifications.
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