
8-bit, 3-state buffer IC featuring BICMOS technology. This non-inverting scan test device offers 8 channels with 8 inputs and 8 outputs. Operating from a 4.5V to 5.5V supply, it supports a high level output current of -15mA and a low level output current of 64mA. Packaged in SOIC for surface mounting, it operates within a temperature range of 0°C to 70°C with a propagation delay of 29ns.
Texas Instruments SN74BCT8244ADW technical specifications.
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