The 74ABT00N112 is a 4-input NAND gate integrated circuit from NXP, operating within a temperature range of -40°C to 85°C. It features a maximum supply voltage of 5.5V and a minimum supply voltage of 4.5V. The device has a high level output current of 20mA and a low level output current of 15mA. The 74ABT00N112 is packaged in a DIP package and is available in quantities of 25. It has a propagation delay of 3.6ns and a turn-on delay time of 2.5ns, with a quiescent current of 50uA.
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NXP 74ABT00N112 technical specifications.
| Package/Case | DIP |
| High Level Output Current | 20mA |
| Lead Free | Lead Free |
| Logic Function | NAND GATE |
| Low Level Output Current | 15mA |
| Max Operating Temperature | 85°C |
| Min Operating Temperature | -40°C |
| Max Supply Voltage | 5.5V |
| Min Supply Voltage | 4.5V |
| Mount | Through Hole |
| Number of Circuits | 4 |
| Number of Gates | 4 |
| Number of Input Lines | 2 |
| Number of Inputs | 2 |
| Number of Output Lines | 1 |
| Package Quantity | 25 |
| Packaging | Rail/Tube |
| Propagation Delay | 3.6ns |
| Quiescent Current | 50uA |
| Radiation Hardening | No |
| Series | 74ABT |
| Turn-On Delay Time | 2.5ns |
| RoHS | Compliant |
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